B10
IEC Low Frequency Emission Analyzer (IEC555-2/3 IEC1000-3-2/3 En61000-3-2/3)

B10 is a fully digital instrument measuring harmonics, flicker and voltage fluctuations in full compliance with the latest IEC1000-3-2 and IEC1000-3-3 EMC standards. B10 takes advantage of the long standing experience of Boconsult IdS in Flicker measurements and Spitzenberger+Spies in harmonics measurements, and it is easily integrable with the Spitzenberger+Spies PHE complete test system.

Though B10 is particularly suitable for integration in test systems racks (19"-3U), it can be used also as a stand alone instrument remotely controlled by a PC. Due to its high performance and low cost, B10 is an optimum solution for laboratories, test houses and electronic equipment manufacturers.

Its dual processor architecture and its high resolution over-sampling A/D converters allow high accuracy and repeatability of measurements.

B10 is nether a spectrum analyzer nor a power analyzer modified for IEC555: its hardware and firmware architecture is specifically designed to meet the requirements of the relevant Standards.

The harmonic analyzer monitors two isolated input channels (one for current and one for voltage) at 50 or 60Hz; it can measure up to the 40th or 50th harmonic, computing FFT on 2048 points, based on rectangular time-windows of 16 periods with no gaps or overlaps; the sampling rate is strictly synchronized to the fundamental thanks to a two-stage PLL.

Very accurate dynamic limits management for Class C and D equipments is provided: for each time-window all necessary values are continuously computed to evaluate the actual limit values in real-time. Moreover the possibility for some harmonics to override the limit up to 1.5 times, for maximum 10% of each 2.5 min. period, is automatically achieved using a sliding mode technique. Limits can be also defined by the user to allow testing at lower values (e.g. at 90% of the standard limits).

Both "steady-state harmonics" and "transitory harmonics" are measured; the specified smoothing filtering (t=1.5s) is a 1st order low pass digital filter and it is user selectable.

The measuring shunt is divided into different ranges: this is to ensure compliance both with the IEC1000-3-2 requirement that the maximum voltage drop in the measurement circuit does not exceed 150mVp, as well as to allow the highest degree of measurement accuracy at low current levels.

Digital outputs are available on a 9 pole "D" connector to control external range selection and reference impedance insertion in integrated automatic test systems.

The specified main operating modes are: "Steady-state harmonics / Single-shot" (1 time-window), "Transitory harmonics / 2.5 minutes" measurements and data collection (469 time-windows at 50Hz or 563 at 60Hz), and "Continuous mode", with full management of transitory harmonics, and automatic stop when limits are exceeded. The collected data are stored in a circular buffer so that the last 2.5 minutes measurement data are available.

Voltage harmonics are continuously evaluated in order to check the power source during the measurement cycle, as required by IEC1000-3-2.

The voltage and current shapes, the amplitude of any harmonic versus time, as well as the real-time voltage and current spectra are available for monitoring on two analog outputs BNCs.

Automatic self-calibration procedures allow fine adjustments for offset and gain, granting very accurate and stable measurements from 5mARMS to 16ARMS.

The fully compliant IEC868 Flicker measurements are based on two input channels fully auto-ranging in the range 40÷504VRMS. This allows to simultaneously measure the EUT and check the power source (Pst<0.4). Two software selectable analog outputs allow the complete visual monitoring of significant signals such as "instantaneous flicker sensation" or "d(t) relative voltage change characteristic" for each channel. Flicker produced by fluctuating harmonics is correctly measured.

Self-test functions grant measurement correctness.

The IEEE-488 interface allows the B10 to be easily integrated into an automated test system and aids fast data transfer to a host PC. Its galvanic isolation is very useful in complete test systems to avoid ground loops.