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B10 is a fully digital instrument
measuring harmonics, flicker and voltage fluctuations in full
compliance with the latest IEC1000-3-2 and IEC1000-3-3 EMC standards.
B10 takes advantage of the long standing experience of Boconsult
IdS in Flicker measurements and Spitzenberger+Spies in harmonics
measurements, and it is easily integrable with the Spitzenberger+Spies
PHE complete test system.
Though B10 is particularly
suitable for integration in test systems racks (19"-3U),
it can be used also as a stand alone instrument remotely controlled
by a PC. Due to its high performance and low cost, B10 is an
optimum solution for laboratories, test houses and electronic
equipment manufacturers.
Its dual processor architecture
and its high resolution over-sampling A/D converters allow high
accuracy and repeatability of measurements.
B10 is nether a spectrum
analyzer nor a power analyzer modified for IEC555: its hardware
and firmware architecture is specifically designed to meet the
requirements of the relevant Standards.
The harmonic analyzer monitors
two isolated input channels (one for current and one for voltage)
at 50 or 60Hz; it can measure up to the 40th or 50th harmonic,
computing FFT on 2048 points, based on rectangular time-windows
of 16 periods with no gaps or overlaps; the sampling rate is
strictly synchronized to the fundamental thanks to a two-stage
PLL.
Very accurate dynamic limits
management for Class C and D equipments is provided: for each
time-window all necessary values are continuously computed to
evaluate the actual limit values in real-time. Moreover the
possibility for some harmonics to override the limit up to 1.5
times, for maximum 10% of each 2.5 min. period, is automatically
achieved using a sliding mode technique. Limits can be also
defined by the user to allow testing at lower values (e.g. at
90% of the standard limits).
Both "steady-state
harmonics" and "transitory harmonics" are measured;
the specified smoothing filtering (t=1.5s) is a 1st order low
pass digital filter and it is user selectable.
The measuring shunt is divided
into different ranges: this is to ensure compliance both with
the IEC1000-3-2 requirement that the maximum voltage drop in
the measurement circuit does not exceed 150mVp, as well as to
allow the highest degree of measurement accuracy at low current
levels.
Digital outputs are available
on a 9 pole "D" connector to control external range
selection and reference impedance insertion in integrated automatic
test systems.
The specified main operating
modes are: "Steady-state harmonics / Single-shot"
(1 time-window), "Transitory harmonics / 2.5 minutes"
measurements and data collection (469 time-windows at 50Hz or
563 at 60Hz), and "Continuous mode", with full management
of transitory harmonics, and automatic stop when limits are
exceeded. The collected data are stored in a circular buffer
so that the last 2.5 minutes measurement data are available.
Voltage harmonics are continuously
evaluated in order to check the power source during the measurement
cycle, as required by IEC1000-3-2.
The voltage and current
shapes, the amplitude of any harmonic versus time, as well as
the real-time voltage and current spectra are available for
monitoring on two analog outputs BNCs.
Automatic self-calibration
procedures allow fine adjustments for offset and gain, granting
very accurate and stable measurements from 5mARMS to 16ARMS.
The fully compliant IEC868
Flicker measurements are based on two input channels fully auto-ranging
in the range 40÷504VRMS. This allows to simultaneously measure
the EUT and check the power source (Pst<0.4). Two software
selectable analog outputs allow the complete visual monitoring
of significant signals such as "instantaneous flicker sensation"
or "d(t) relative voltage change characteristic" for
each channel. Flicker produced by fluctuating harmonics is correctly
measured.
Self-test functions grant
measurement correctness.
The IEEE-488 interface allows
the B10 to be easily integrated into an automated test system
and aids fast data transfer to a host PC. Its galvanic isolation
is very useful in complete test systems to avoid ground loops.

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